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Philosophical Magazine Volume 90, 2010 - Issue 35-36: Electron Microscopy and Diffraction of Defects, Nanostructures, Interfaces and Amorphous Materials: Conference to Mark the Retirement of Professor David Cockayne FRS
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Original Articles

The development and early applications of the weak-beam technique

M.J. Whelan Department of Materials, Parks Road, Oxford, OX1 3PH, UKCorrespondence[email protected]
Pages 4611-4622 | Received 08 Oct 2009, Accepted 19 Dec 2009, Published online: 11 Jun 2010
 
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Abstract

A short review is provided of the way the weak-beam technique was developed for observing dislocations at higher resolution than previously attained. Some of the early applications of the technique are described.

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