Applications of the Oxford-JEOL aberration-corrected electron microscope

Abstract

A review is provided of the use of aberration-corrected electron microscopy at Oxford from 2003 to the present day. In particular, examples of work carried out in Oxford during this period are described. Aberration-corrected exit wave function reconstruction is used to examine the surface structure of a catalyst nanoparticle. It is shown that tilt-series reconstruction can retrieve higher spatial resolution information. The Z-contrast nature of annular dark field scanning transmission electron microscopy can be used to quantitatively locate dopant atoms in an intergranular film. The recording of annular dark field images on an absolute intensity scale is demonstrated and, finally, it is shown that confocal trajectories can dramatically improve the depth resolution for optical sectioning.

Keywords:

• aberration correction
• HRTEM
• STEM
• confocal microscopy

Acknowledgements

The authors would like to acknowledge financial support from the Leverhulme Trust (F/08 749/B) and the EPSRC (EP/F048009/1) and Intel Ireland. Technical assistance from JEOL Ltd. and JEOL (UK) Ltd. is also acknowledged.