TEM imaging of an inclined dislocation in an anisotropic thin foil

Abstract

The elastic distortions nearby the two emerging points of a straight inclined dislocation located in an elastically anisotropic thin foil are expressed with the aid of the integral formalism [D.M. Barnett and J. Lothe, Phys. Norv. 7 (1973) p.13], an approach complementary to that of the Eshelby's “sextic” formalism. They are included in the calculation of the intensities of diffracted beams in transmission electron microscopy to produce theoretical images, a well known procedure when elastic free surface relaxation is ignored. Examples of theoretical images point out some contrast differences between images calculated with the assumptions of isotropic and anisotropic crystals. These calculations can be simplified for a dislocation normal to the surface and a line direction parallel to a two-fold axis.

Keywords:

• dislocation
• surface
• anisotropic elasticity
• transmission electron microscopy

Acknowledgments

I would like to thank Professor D.H. Warrington for his pertinent comments on the manuscript.