Estimation and Reduction of Macroscopic Nonuniformity in CNT Thin Film Resistors

Abstract

Carbon nanotube (CNT) thin film-based devices are expected to have better uniformity and reproducibility compared with single-tube devices due to statistical averaging. In this work, thin film resistors (TFR) were prepared from CNT dispersions and their nonuniformity estimated by multipoint, two-terminal resistance (TTR) measurements. I-V measurements were done for determining the nature of metal-CNT contact. For estimation of contact resistance, transmission line measurements (TLM) were carried out. Reduction of CNT-TFR nonuniformity was achieved using di-methyl formamide (DMF). Scanning electron microscopy and electrical measurements imply that DMF improves debundling of single-walled nanotubes, reduces the resistance and improves homogeneity of subsequently prepared thin films.

Keywords:

• CNT TFR
• nonuniformity
• contact resistance

Acknowledgments

We thank the characterization division of Solid State Physics Laboratory (SSPL), Delhi, India, for providing SEM characterization of CNT-TFR.