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Original Articles

Surface Potential of Graphene Oxide Investigated by Kelvin Probe Force Microscopy

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Pages 777-781 | Received 25 Nov 2014, Accepted 08 Dec 2014, Published online: 18 May 2015
 

Abstract

In the paper, the graphene oxide (GO) prepared by modified Hummers method was characterized by Raman spectrum, Fourier transform infrared spectrum (FTIR), and Atomic Force Microscopy (AFM). Using Kelvin Probe Force Microscopy (KPFM), the surface potential of GO was investigated, and it was found that the GO film exhibited the uniform surface potential distribution. The surface potentials at the edges and wrinkles of GO film were much lower than that at the in-plane flat area, which is proposed to be contributed to the bonds’ unsaturated and disorder at these zones. These results provide insight into understanding electronic properties of GO-based composites and devices.

Funding

This work was supported by the Grants from National Natural Science Foundation of China (No. 51172191 and 11204259) and National Basic Research Program of China (2012CB921303).

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