Mg_xC₆₀ Fabricated by Using Mg:C₆₀ Co-Evaporation Method for Carrier Doping

Abstract

Mg:C₆₀ co-evaporation method has been performed to obtain fulleride of Mg_xC₆₀ thin films for carrier doping. Atomic concentration of the film has been examined by x-ray photoelectron spectroscopy to calibrate the composition ratio, and the results indicated that Mg concentration in the film was controlled well. Then, crystal structure of the Mg:C₆₀ mixing film has been examined by using grazing incidence x-ray diffraction method. The diffraction patterns suggested that these films were microcrystalline Mg_xC₆₀. Conductivity of the mixing films was increased as composition ratio of Mg increasing. It indicates that Mg atoms acted as carrier dopant.

Keywords:

• Co-evaporation
• grazing incidence X-ray diffraction (GIXD)
• Mg_xC₆₀
• X-ray photoelectron spectroscopy (XPS)

Acknowledgment

This work was partly supported by New Energy and Industrial Technology Development Organization (NEDO) of Japan.