Abstract
A method to characterise the dielectric properties of liquid crystal materials at microwave frequencies is presented that utilises a microstrip line with a layer of liquid crystal as a substrate. Accurate modelling of the liquid crystal and microwave fields is used to determine the dielectric properties of the liquid crystal from experimental measurements. The method is applied to a number of liquid crystal materials.
Acknowledgment
The authors wish to acknowledge the support of the UK Engineering and Physical Sciences Research Council (EPSRC).