Two Dimensional Grazing Incidence X-Ray Diffraction of TIPS-Pentacene Thin Films

Abstract

We report crystal structure of TIPS-pentacene thin films studied by two dimensional grazing incidence x-ray diffraction (2D-GIXD). Thin films were fabricated by dry and wet processes, and precisely compared the crystal structures of the fabricated films. Slight differences in the unit cell parameters are found in the films. Furthermore, a new polymorph is identified in the film fabricated at sufficiently low substrate temperature, − 166°C. The unit cell parameters of the new polymorph are determined by analyzing the 2D-GIXD pattern.

Keywords:

• Organic semiconductors
• TIPS-pentacene
• X-ray diffraction
• 2D-GIXD
• polymorph

Acknowledgments

This synchrotron radiation experiments were performed at BL19B2 in Spring-8 with the approval of Japan Synchrotron Radiation Research Institute (JASRI). (Proposal No. 2011A0036)