Abstract
A Cu2ZnSnS4(CZTS) film was formed by the sulfurization of Cu(Zn, Sn) (CZT) alloy precursors. The sulfurization was performed in evacuated and sealed quartz ampoules with various amount of supplied sulfur powder. The crystallization of the CZTS films as a function of the sulfur content was determined based on X-ray diffraction (XRD) patterns. The XRD analysis indicated that the Cu-Sn/Zn metal precursor was crystallized with various secondary phases, such as ZnS, Cu2S, Cu3Sn, Cu2SnS3, and Cu2SnS7. We also found that the energy gap of CZTS absorber was 1.48–1.51 eV.
Acknowledgment
This study was supported by the Daegu University Research Grant, 2012.