Maximizing Performance Of Optoelectronic System Through Minimizing Its Sensibility To Brittle Failure

Abstract

Using the nonequilibrium density matrix method for an open system coupled weakly to the environment the problem of maximizing performance of defected system via minimizing its sensibility to failures is considered in an absorbing Markov chain framework. The objective is defined by maximizing competitiveness coefficient associated with the one-quarter inversion of the minimum of maximum sensitivity of the peak population of failure-prone state with respect to increase in log input rate. It is shown that competitiveness coefficients calculated from simulations of brittle failures for three IR-transmitting window materials are in agreement with their performance derived from experiments.

Keywords:

• optoelectronic systems
• failure states
• performance
• competitiveness

Acknowledgements

The calculations were run on the computer cluster at Bogolyubov Institute for Theoretical Physics of National Academy of Sciences of Ukraine. The present work was partially supported by The National Academy of Sciences of Ukraine (project No. 0116U002067).