ABSTRACT
Cast and vacuum-deposited films of several kinds of n-alkanes with different crystal systems were made on a glass substrate. X-ray diffraction (XRD) data showed that n-alkane molecules in both the cast and the vacuum-deposited films were essentially aligned perpendicularly on the substrate. When the vacuum-deposited film of n-alkane became thicker, the XRD pattern indicated that n-alkane molecules in the upper layer lay on the perpendicularly aligned n-alkane layer. Molecular alignment of the film of head-to-tail-type poly(3-hexylthiophene-2,5-diyl), HT-P3HexTh, also depended on the thickness of the film.
Acknowledgments
This research was partly supported by the 21st-Century Center of Excellence program.
Notes
a From the (00l) peaks with d l the d spacing of the original peak (d = d l × l) was evaluated. The d spacings calculated from the (00l) peaks (l = 1, 2,…) were averaged to give the value given in the parentheses.
b Data of additionally observed peak for the upper layer of the thicker film (cf. the text).
a The molar ratio of n-alkane in the solution used for film preparation. Cast from chloroform.
b The peak assigned for (001) plane of n − C30H62 is described as 30-(001). (00l) diffraction peak of new crystal phase are described as X-l. Three new crystalline phases were observed in this study.
a The molar ratio of n-alkane in the solution used for film preparation. Cast from chloroform.
b The peak assigned for (001) plane of n − C30H62 is described as 30-(001).(00l) diffraction peak of new crystalline phase is described as Y-l.
a The molar ratio of n-alkane in the solution used for film preparation. Cast from chloroform.
b The peak assigned for (002) plane of n-C29H60 is described as 29-(002). (00l) diffraction peak of a new crystalline phase is described as Z-l.