ABSTRACT
Maximum power generation from solar modules is adversely affected by partial shading conditions. To strengthen and obtain feasible output under any complex shadings, a new double diode model with deterioration factor (DDM-DF) is proposed for the optimal selection of shading patterns. It is used to validate the effectiveness of the novel heuristic approach called time-distance-constrained topology (D-CT). The novel D-CT is compared with conventional techniques (bridge link (BL), series-parallel (S-P), total cross-tied (TCT)), conventional puzzles (sudoku (SDK), magic-square (M-SP)), and recently reconfigured techniques (permutation-combination (PCR), knight-tour (KTR)). In this paper, the experimental study validates the outcomes obtained by MATLAB/SIMULINK results under various realistic shadings. Experimental results prove that the novel proposed D-CT enhances the efficiency by 5.45%, 3.57%, and 3.54% over TCT, PCR, and KTR under inverted-L shading. Further, the minimum and maximum mismatch loss reduced by the proposed D-CT is up to 1.90% and 97.61% under top shading against SDK and S-P respectively. The real-time validation for the proposed novel 4×4 D-CT under pi and diagonal shading exhibits greater performance parameter enhancement of a solar array subjected to shadings in correlation with other models.
Nomenclature
KCL | = | Kirchoff’s current law |
V | = | Output voltage of PV cell (V) |
ZPSC | = | Insolation level under PSC (W/m2) |
n1, n2 | = | Diode’s ideality factor |
NCR | = | New contour reconfiguration |
ID1, ID2 | = | Diode currents (A) |
k | = | Boltzmann constant (1.38 |
VPD | = | Vertical percentage degradation (%) |
BH | = | Combined shaded module horizontally |
q | = | Electron charge (1.602 |
DDM | = | Double diode model |
RS | = | Series resistance (Ω) |
HPD | = | Horizontal percentage degradation |
RP | = | Parallel resistance (Ω) |
IPH | = | Current of a photon (A) |
S | = | Series |
S-P | = | Series-Parallel |
I | = | Output current of PV cell (A) |
T | = | Operating temperature (deg C) |
I01, I02 | = | Diode reverse saturation current (A) |
TPD | = | Total percentage degradation |
IP | = | Parallel current (A) |
TT | = | Triple-Tied |
Disclosure statement
No potential conflict of interest was reported by the authors.