Abstract
Single crystals of Bi2Se3 were grown by vapor phase technique using ammonium chloride (NH4Cl) as a transporting agent. The stoichiometry of the as-grown Bi2Se3 crystal was confirmed by energy-dispersive analysis of X-ray. The lattice parameters, crystallite size, and stacking fault probabilities were determined from X-ray powder diffractogram. The surface morphology of the as-grown single crystals was studied using AFM image. The Seebeck coefficient and resistivity variation from low (6 K) to near ambient temperature on these as-grown Bi2Se3 single crystals was measured. The Hall effect measurements were carried out at three different low temperatures. The obtained results are discussed in detail.
Acknowledgments
All the authors are thankful to the Sophisticated Instrumentation Centre for Applied Research & Testing (SICART), Vallabh Vidyanagar, Gujarat, for EDAX and XRD analysis. The authors are also grateful to the UGC-DAE Consortium for Scientific Research, Indore Centre, India for allowing us to carry out TEP, resistivity, and AFM work on the samples.