Abstract
Metal chalcogenide thin films of copper sulfide (CuxS) were grown on glass substrate using the chemical bath deposition. The CuxS thin film XRD studies reveal chalcocite low and covellite phases called as copper-rich and copper-poor form. The average grain size was calculated in the range of 8.87–69.65 nm. The optical band gap was estimated using Tauc's plot and found to be 3.02–4.06 eV. Optical properties exhibit that film find application in photovoltaic and photo thermal fields. AFM studies show formation of spherical shaped nanoparticle together with fine particles ranging 10 to 500 nm, evenly distributed showing homogeneity in polycrystalline thin film formation. SEM studies reveal spherical grain formation with cracks and pin holes at some places.
Acknowledgments
The authors are thankful to Prof. Ajay Gupta for providing the experimental facilities at UGC-DAE CSR Indore. The authors are also thankful to Dr. Mukul Gupta for XRD measurements, Mr. Mohan Gangarade extending the AFM measurements, and Dr. D.M Phase and Mr. Manoj Kumar for thickness measurement.
Funding
The authors are grateful to UGC-DAE Consortium for Scientific Research INDORE-CENTRE, DAVV Campus, Khandwa Road, Indore 452017 (India).