Transmission electron microscopy characterization of different nanotubes

ABSTRACT

The aim of this study is to present transmission electron microscopy (TEM) as a powerful instrument for characterization of nanostructural materials, in particular, nanotubes. Various nanotubes such as typical multiwall carbon nanotubes (MWCNTs), high-crystalline MWCNTs, and vanadium oxide nanotubes (VONTs) in different conditions are investigated by a TEM (Philips EM208S-100 kV). This work was carried out by analysis and investigation of TEM micrographs. In addition, the lattice structures of MWCNTs and VONTs were obtained by electron diffraction patterns (EDPs). The parameters of nanotubes such as length, diameter, number of walls, statistical distribution of diameter and atomic structures including lattice parameter information, and exact crystallographic description of crystal can be obtained by TEM. In fact, main crystallographic features and structural properties of nanotubes are determined and explained by means of EDP technique. Finally, this investigation will determine that characterization of nanotubes becomes easy by TEM and EDP techniques.

KEYWORDS:

• Transmission electron microscopy
• electron diffraction pattern
• multiwall carbon nanotube
• vanadium oxide nanotube

Funding

The authors would like to thank the TEM laboratory in Advanced Materials Group of Materials Research School for their financial supports.