Abstract
Process capability analysis plays an important role in statistical quality control. We present the process yield index TSpkA to evaluate the process yield for multivariate linear profiles in manufacturing processes. This index provides an exact measure of the process yield. In addition, an approximate confidence interval for TSpkA is constructed. A simulation study is conducted to assess the performance of the proposed method for multivariate linear profiles data under mutually independent normality and multivariate normality. The simulation results confirm that the estimated TSpkA is close to the target value with smaller standard deviation as the sample size increases.
Acknowledgements
The author gratefully acknowledges the referee of this paper who helped to clarify and improve the presentation.
Disclosure statement
The authors report no conflicts of interest. The authors alone are responsible for the content and writing of this article.
Notes on contribuor
Fu-Kwun Wang, is a Professor in the Department of Industrial Management at the National Taiwan University of Science & Technology, Taiwan. His fields of interest are reliability engineering, quality control and production management.