Process yield analysis for multivariate linear profiles

Abstract

Process capability analysis plays an important role in statistical quality control. We present the process yield index TS_pkA to evaluate the process yield for multivariate linear profiles in manufacturing processes. This index provides an exact measure of the process yield. In addition, an approximate confidence interval for TS_pkA is constructed. A simulation study is conducted to assess the performance of the proposed method for multivariate linear profiles data under mutually independent normality and multivariate normality. The simulation results confirm that the estimated TS_pkA is close to the target value with smaller standard deviation as the sample size increases.

Keywords:

• Confidence interval
• multivariate linear profiles
• process capability analysis
• process yield

Acknowledgements

The author gratefully acknowledges the referee of this paper who helped to clarify and improve the presentation.

Disclosure statement

The authors report no conflicts of interest. The authors alone are responsible for the content and writing of this article.

Notes on contribuor

Fu-Kwun Wang, is a Professor in the Department of Industrial Management at the National Taiwan University of Science & Technology, Taiwan. His fields of interest are reliability engineering, quality control and production management.