ABSTRACT
Lifetime is a crucial quality characteristic of electronic products that must be monitored using control charts. Lifetime may provide right-censored data. A conditional expected value (CEV) x̄ control chart was developed to monitor type I right-censored data. Researchers had always assumed that the censored time is a known constant when designing control charts. This study provides an economic design model for optimizing CEV x̄ charts and type I right-censored time for reducing costs associated with quality control and life tests. This method was employed on a practical case of a liquid crystal display module. A sensitivity analysis was also conducted on the influence of the model parameters on the design and censored time of the CEV x̄ chart.
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Correction Statement
This article has been republished with minor changes. These changes do not impact the academic content of the article.
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Pei-Hsi Lee
Pei-Hsi Lee received his PhD degree in Institute of Industrial Engineering and Management from National Yunlin University of Science & Technology, Taiwan. He is an associate professor of the School of Internet Economics and Business at the Fujian University of Technology, Fuzhou city, China. Before joining Fujian University of Technology, Dr Lee served as a manager in the smart factory development department of a rubber company in Taiwan, for 7 years and was an assistant professor at Chung Yuan Christian University in Taiwan, for 2 years. His fields of interest are smart quality control system, reliability engineering, and smart production management.