A lamp location problem based on system reliability

ABSTRACT

This paper studies one- and two-dimensional lamp location problems considering system reliability. Within the system, several identical lamps are used to cover the system service area, and each lamp can cover a circular area. Lamps could be working or fail, and the system works when working lamps can cover the entire system. System reliability is defined as the probability that the whole area is covered. To check the system state, the Voronoi diagram is used, and the signature method is applied to calculate the system reliability. The primary contribution involves applying a redundancy-based heuristic location strategy to optimize system reliability in lamp system. In method evaluation, the proposed method is compared with other location methods. A genetic algorithm (GA) that employs heuristic solutions as initial input to access the heuristic performance is designed. Finally, numerical experiments suggesting the heuristic method provide a pseudo-optimal solution.

KEYWORDS:

• System reliability
• lamp problem
• set covering location problem
• reliability optimization
• genetic algorithm

Disclosure statement

No potential conflict of interest was reported by the author(s).

Additional information

Funding

This research was supported by the Basic Science Research Program (2022R1F1A10710571162182065300101) through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, and the National Natural Science Foundation of China (Nos. 71971050 and71831006).

Notes on contributors

Zilong Feng

Zilong Feng ([email protected]) received a BS.E in Industrial Engineering in 2018 from Chonnam National University, Gwangju, South Korea. He is currently working toward a Ph.D. at Pusan National University. His main research interests include lamp problems, system reliability, and operational research.

Ruiyou Zhang

Ruiyou Zhang ([email protected]) received a B.Sc. in Automation and a Ph.D. in Systems Engineering from Northeastern University, Shenyang, China, in 2002 and 2007, respectively. He is currently a Tenured Professor in the College of Information Science and Engineering at Northeastern University in China. His major research interests include modeling and optimization, intelligent manufacturing, logistics and transportation, and service science and engineering.

Won Young Yun

Won Young Yun ([email protected]) received a BS.E in Industrial Engineering from Seoul National University, Korea, in 1982 and an M.S. and a D.Eng. in Industrial Engineering from the Department of Industrial Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea, in 1984 and 1988, respectively. He is currently a Professor in the Department of Industrial Engineering at Pusan National University, Busan, Korea. His research interests include the Design and Analysis of Accelerated Life Tests, Warranty Policies, Maintenance Policies, Reliability-centered Maintenance, and Simulations.