Dear Colleagues, Authors and Readers of IPSE journal:
The international journal Inverse Problems in Engineering (IPE) that was founded in October 1994 and changed its name to Inverse Problems in Science and Engineering (IPSE) in February 2004, has celebrated its 18 years of existence. It currently has an average of 180 pages per issue and is published eight times per year.
I am grateful for the number of years of service devoted to IPSE journal by several of our distinguished colleagues who have fully served their terms as members of the Board of Scientific Advisors or members of the Board of Associate Editors and helped IPSE journal with their expertise and invaluable time. These colleagues are:
H. Thomas Banks (U.S.A.)
Jean-Luc Battaglia (France)
Ryszard A. Bialecki (Poland)
Tadeusz Burczynski (Poland)
Ashley Emery (U.S.A.)
Jay I. Frankel (U.S.A.)
Bernd Hofmann (Germany)
Tomas Johansson (United Kingdom)
Ville Kolehmainen (Finland)
Antonio C. G. Leitao (Brazil)
Otmar Scherzer (Austria)
Maxim Shishlenin (U.S.A.)
Michael S. Zhdanov (U.S.A.)
During the past few years, it became apparent that rapidly increasing diversity and number of the submitted papers needs additional dynamic Associate Editors. I would like to welcome these colleagues that have just joined the Board of the Associate Editors:
Habib Ammari (France)
Marcelo J. Colaco (Brazil)
Abdellatif Elbadia (France)
Xu Han (P. R. China)
Benny Y.C. Hon (China)
Jijun Liu (P.R. China)
Peter Maas (Germany)
Thamban Nair (India)
Roman Novikov (France)
Jin Keun Seo (Korea)
Marian Slodicka (Belgium)
Zenon Waszczyszyn (Poland)
I would also like to announce that Professor Anatoly G. Yagola, one of the pioneers of regularization approach to inverse problems, who has served highly professionally for a number of years on the Board of Associate Editors of IPSE, has accepted my invitation to become a member of the Board of Scientific Advisors of IPSE.
It is my hope that these changes will bring further improvements to IPSE's quality and contribute to an even faster growth of IPSE journal.