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Science and Technology of Advanced Materials Volume 1, 2000 - Issue 2
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Original Articles

High resolution transmission electron microscopy study in VC-doped WC–Co compound

T. YamamotoEngineering Research Institute, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-8656, JapanCorrespondence[email protected]
,
Y. IkuharaEngineering Research Institute, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-8656, Japan
&
T. SakumaDepartment of Advanced Materials Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-8656, Japan
Pages 97-104 | Received 01 Mar 2000, Accepted 23 Mar 2000, Published online: 20 Jul 2000

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