Publication Cover
Applicable Analysis
An International Journal
Volume 52, 1994 - Issue 1-4
15
Views
4
CrossRef citations to date
0
Altmetric
Original Articles

A uniqueness theorem for reverse biased diodes

Pages 261-276 | Received 14 Nov 1991, Published online: 02 May 2007

References

  • Adams , R.A. 1975 . “ Sobolev Spaces ” . New York : Academic Press .
  • Alabau , F. 1991 . “ Proceedings of the First European Conference on Elliptic and Parabolic Problems ” . Pont-a-Mousson .
  • Alabau , F. in press . To appear in Nonlinear Anal .
  • Alabau , F. 1990 . C.R. Acad. Sc., I . 311 : 589 – 592 .
  • Alabau , F. 1990 . Nonlinear Anal. Theory Methods Appl . 14 : 123 – 139 .
  • Bank , R.E. , Jerome , J.W. and Rose , D.J. 1982 . “ Research report 82-11274-2 ” . Bell Laboratories .
  • Brezzi , F. , Capelo , A. and Gastaldi , L. 1989 . Siam J. Math. Anal. . 20 : 372 – 387 .
  • Chow , S.N. and Hale , J.K. 1982 . “ Methods of bifurcation theory. ” . New York : Springer . Heidelberg,Berlin
  • Coddington , E.A. and Levinson , N. 1955 . “ Theory of ordinary differential equations. ” . In Mac Graw Hill New York Toronto,London
  • Kerkhoven , T. 1988 . Siam J. Sci. Stat. Comput. . 9 : 48 – 60 .
  • Kerkhoven , T. 1991 . Siam J. Appl. Math. . 51 : 748 – 774 .
  • Markowich , P.A. 1986 . “ The stationary semiconductor device equations ” . New York : Springer .
  • Markowich , P.A. and Schmeiser , C. 1986 . I.M.A. J. Appl. Math. . 36 : 43 – 57 .
  • Mock , M.S. 1982 . Compel, Int. J. Comput. Math. Electr. Electron. Eng. . 1 : 165 – 174 .
  • Mock , M.S. 1983 . “ Analysis of mathematical models of semiconductor devices. ” . Dublin : Boole Press .
  • Protter , M.H. and Weinberger , H.F. 1967 . “ Masimum principies in differential equations ” . In Prentice Hall, Englewood Cliffs.
  • Seidman , T.I. 1980 . Nonlinear Anal . Theory Methods Appl , 4 : 623 – 637 .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.