Interfacial layer observed by ellipsometry in MOCVD grown Pb(Zr, Ti)O₃ thin films

M. P. Moret University of Nijmegen, Research Institute of Materials, Toernooiveld 1, 6525ED, Nijmegen, The Netherlands

S. A. Rössinger University of Nijmegen, Research Institute of Materials, Toernooiveld 1, 6525ED, Nijmegen, The Netherlands

P. R. Hageman University of Nijmegen, Research Institute of Materials, Toernooiveld 1, 6525ED, Nijmegen, The Netherlands

M. A. Devillers University of Nijmegen, Research Institute of Materials, Toernooiveld 1, 6525ED, Nijmegen, The Netherlands

H. Van Der Linden University of Nijmegen, Research Institute of Materials, Toernooiveld 1, 6525ED, Nijmegen, The Netherlands

E. Haverkamp University of Nijmegen, Research Institute of Materials, Toernooiveld 1, 6525ED, Nijmegen, The Netherlands

P. K. Larsen University of Nijmegen, Research Institute of Materials, Toernooiveld 1, 6525ED, Nijmegen, The Netherlands

N. Duan University of Twente, Inorganic Materials Science Group, Enschede, The Netherlands

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