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Ferroelectrics Volume 241, 2000 - Issue 1
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Section XV: Thin films

Quantitative analysis of preferential orientation components of ferroelectric thin films

J. Ricote Laboratoire de Physique de l'État Condensé, Université du Maine-Le Mans, BP 535, 72085, Le Mans, FRANCE; Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, 28049, Madrid, SPAIN
,
D. Chateigner Laboratoire de Physique de l'État Condensé, Université du Maine-Le Mans, BP 535, 72085, Le Mans, FRANCE
,
L. Pardo Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, 28049, Madrid, SPAIN
,
M. Algueró Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, 28049, Madrid, SPAIN; Queen Mary and Westfield College, University of London, London, E1 4NS, UNITED KINGDOM
,
J. Mendiola Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, 28049, Madrid, SPAIN
&
M. L. Calzada Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, 28049, Madrid, SPAIN
Pages 167-174 | Received 12 Jul 1999, Published online: 09 Mar 2011

References

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  • Kholkin , A. L. , Calzada , M. L. , Ramos , P. , Mendiola , J. and Setter , N. 1996 . Appl. Phys. Letters , 69 : 3602 – 3604 .
  • Calzada , M. L. , Algueró , M. and Pardo , L. 1998 . J. Sol-Gel Science and Technology , 13 : 837 – 841 .
  • Sirera , R. and Calzada , M. L. 1995 . Mat. Res. Bull. , 30[1] : 11 – 18 .
  • Matthies , S. and Vinel , G. W. 1982 . Phys. Stat. Sol. B , 112 : K111 – K120 .
  • Wenk , H. R. , Matthies , S. , Donovan , J. and Chateigner , D. 1998 . J. Appl. Cryst. , 31 : 262 – 269 .
  • Algueró , M. , Calzada , M. L. and Pardo , L. 1999 . J. Eur. Ceram. Soc , 19 : 1481 – 1484 .
  • Jiménez , R. , Calzada , M. L. and Mendiola , J. Proceedings of the 11th ISAF . pp. 155 – 158 . IEEE catalog number 98CH36245

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