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Ferroelectrics Volume 254, 2001 - Issue 1
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Original Articles

Structural characterization of PZT thin films and related properties

T. Badéche L2MP (UMR CNRS) UTV, Bǎt R, BP 132, La Garde Cédex, 83957, France
,
Y. Gagou L2MP (UMR CNRS) UTV, Bǎt R, BP 132, La Garde Cédex, 83957, France
,
N. Aliouane L2MP (UMR CNRS) UTV, Bǎt R, BP 132, La Garde Cédex, 83957, France
,
O. A. Aktsipetrov Department of Physics, Moscow State University, Moscow, 119899, Russia
,
M. H. Pischedda L2MP (UMR CNRS) UTV, Bǎt R, BP 132, La Garde Cédex, 83957, France
&
P. Saint-Grégoire L2MP (UMR CNRS) UTV, Bǎt R, BP 132, La Garde Cédex, 83957, France
Pages 403-410 | Published online: 26 Oct 2011

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