Far-Infrared and Raman Spectroscopy of BaTiO₃ Thin Films

T. OSTAPCHUK Institute of Physics Academy of Sciences of the Czech Republic, Na Slovance 2, 18221, Prague, Czech Republic, 8

J. PETZELT Institute of Physics Academy of Sciences of the Czech Republic, Na Slovance 2, 18221, Prague, Czech Republic, 8

J. POKORNÝ Institute of Physics Academy of Sciences of the Czech Republic, Na Slovance 2, 18221, Prague, Czech Republic, 8

A. PASHKIN Institute of Physics Academy of Sciences of the Czech Republic, Na Slovance 2, 18221, Prague, Czech Republic, 8

V. ŽELEZNÝ Institute of Physics Academy of Sciences of the Czech Republic, Na Slovance 2, 18221, Prague, Czech Republic, 8

M. DRESSEL Physikalisches Institut Universität Stuttgart, D-70550, Stuttgart, Germany

B. GORSHUNOV Physikalisches Institut Universität Stuttgart, D-70550, Stuttgart, Germany

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References

Rafaja , D. , Kub , J. , Šimek , D. , Lindner , J. and Petzelt , J. 2002 . Microstructure of BaxSr1-xTiO3 thin films grown on sapphire substrates . Thin Solid Films , 422 : 8 – 13 .
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Servoin , J. L. and Gervais , F. 1980 . Soft mode spectroscopy in barium titanate . J. Phys. C Solid St. Phys. , 13 : 3761 – 3773 .
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Rychetský , I. , Petzelt , J. and Ostapchuk , T. 2002 . Grain-boundary and crack effects on the dielectric response of high-permittivity films and ceramics . Appl. Phys. Lett. , 81 : 4224 – 4226 .
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Far-Infrared and Raman Spectroscopy of BaTiO₃ Thin Films