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Ferroelectrics Volume 465, 2014 - Issue 1: Proceedings of the Thirteenth International Meeting on Ferroelectricity (IMF-13)
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Section D: Characterization of Thin Films

Structure and Multiferroic Properties of V-doped Bi6Fe2Ti3O18 Thin Films Prepared by Chemical Solution Deposition

H. J. KimDepartment of Physics, Changwon National University, Changwon, Gyeongnam641–773, Republic of Korea
,
J. W. KimDepartment of Physics, Changwon National University, Changwon, Gyeongnam641–773, Republic of Korea
,
E. J. KimDepartment of Physics, Changwon National University, Changwon, Gyeongnam641–773, Republic of Korea
,
J. Y. ChoiDepartment of Physics, Changwon National University, Changwon, Gyeongnam641–773, Republic of Korea
,
C. M. RaghavanDepartment of Physics, Changwon National University, Changwon, Gyeongnam641–773, Republic of Korea
,
W.-J. KimDepartment of Physics, Changwon National University, Changwon, Gyeongnam641–773, Republic of Korea
,
M. H. KimSchool of Nano and Advanced Materials Engineering, Changwon National University, Changwon, Gyeongnam641–773, Republic of Korea
,
T. K. SongSchool of Nano and Advanced Materials Engineering, Changwon National University, Changwon, Gyeongnam641–773, Republic of Korea
,
J.-W. KimFunctional Ceramics Group, Korea Institute of Materials Science, Changwon, Gyeongnam641–831, Republic of Korea
&
S. S. KimDepartment of Physics, Changwon National University, Changwon, Gyeongnam641–773, Republic of KoreaCorrespondence[email protected]
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Pages 68-75 | Received 02 Sep 2013, Accepted 11 Oct 2013, Published online: 01 May 2014

References

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