References
- Y. Saito, H. Takao, T. Tani, T. Nonoyama, K. Takatori, T. Homma, T. Nagaya, M. Nagamura, Nature. 432, 84 (2004).
- L Egerton, Dillon DM. J Am Ceram Soc. 42, 438 (1959).
- Guo, K. Kakimoto, H. Ohsato, Solid State Commun. 129, 279 (2004).
- Seo and J. Yoo, J. Kor. Phy. Soc. 23, 617–621 (2010).
- Lee, J. Yoo, K. Lee, I. Kim, J. Song and Y. Park, J. Alloys and Com. 506, 872–876 (2010).
- Kim, J. Yoo, I. Kim and J. Song, J. Appl Physics. 105, 061642–061645 (2009).
- Guo, K. Kakimoto, H. Ohsato, Appl. Phys. Lett. 85, 4141 (2004).
- Matsubara, K. Kikuta, S. Hirano, J. Appl. Phys. 97, 114105 (2005).
- Guo, K. Kakimoto, H. Ohsato, Mater. Lett. 59, 241 (2005).
- Matsubara, T. Yamaguchi, W. Sakamoto, K. Kikuta, T.Yogo and S. J. Hirano, J. Am. Ceram. Soc. 88, 1190 (2005).
- J. Zhang, R. Xia, T. R. Shrout, G. Z. Zang and J. F. Wang, J. Appl. Phys. 100, 104108 (2006).
- Hollenstein, M. Davis, D. Damjanovic and N. Setter, Appl. Phys. Lett. 87, 3182905 (2005).
- EEE Standard on Piezoelectricity, IEEE Std. 176, Institute of Electrical and Electronics Engineers, Inc., (1978).