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International Journal of Electronics Volume 104, 2017 - Issue 2
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Original Articles

Study of the relation between the surface loss and the field flatness in the EID

Yong YinSchool of Physical Electronics, The University of Electronic Science and Technology of China, Chengdu, ChinaCorrespondence[email protected]
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,
Bin WangSchool of Physical Electronics, The University of Electronic Science and Technology of China, Chengdu, ChinaView further author information
,
Hailong LiSchool of Physical Electronics, The University of Electronic Science and Technology of China, Chengdu, ChinaView further author information
&
Lin MengSchool of Physical Electronics, The University of Electronic Science and Technology of China, Chengdu, ChinaView further author information
Pages 204-217 | Received 24 Jun 2015, Accepted 27 Mar 2016, Published online: 20 Jun 2016

References

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