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International Journal of Electronics Volume 62, 1987 - Issue 5
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Physical electronics

The effect of annealing on the AC electrical properties of SiO/SnO2 amorphous thin films

A. S. Md. S. RAHMAN Department of Physics, Brunel University, Uxbridge, Middlesex, U.K.
,
M. H. ISLAM Department of Physics, Brunel University, Uxbridge, Middlesex, U.K.
&
C. A. HOGARTH Department of Physics, Brunel University, Uxbridge, Middlesex, U.K.
Pages 685-690 | Received 27 Nov 1986, Accepted 01 Dec 1986, Published online: 24 Feb 2007

REFERENCES

  • BRODSKY , M. H. , TITLE , R. S. , WEISER , K. , and PETIT , G. D. , 1970 , Structural, optical and electrical properties of amorphous silicon films . Physics Review B , 1 , 2632 – 2641 .
  • CONNELL , G. A. N. , and PAUL , W. J. , 1972 , Is there an intimate relation between amorphous and crystalline semiconductors? Journal of Non-crystalline Solids , 8 – 10 , 215 – 222 .
  • ELLIOTT , P. J. , and JOFFE , A. D. , 1973 , Optical and electrical properties of amorphous gemanium prepared in ultra-high vacuum . Amorphous and Liquid Semiconductors , edited by J. Stuke and W. Brenig , Vol. 2 , ( London Taylor and Francis Ltd .) p. 1139 .
  • HIROSE , H. , and WADA , Y. , 1964 , Dielectric properties and DC conductivity of vacuum-deposited SiO films . Japan Journal of Applied Physics , 3 , 179 – 190 .
  • HOGARTH , C. A. , and WRIGHT , L. A. , 1968 , Some properties of mixed oxide layers having amorphous structures . Proceedings of the International Conference on the Physics of Semiconductors , Moscow , U.S.S.R. ( Nauka: Leningrad ) p. 1274 .
  • ISLAM , M. R. , and HOGARTH , C. A. , 1987 , Some optical and structural studies on SiO/SnO2 thin films . Physica status solidi ( in press ).
  • JOHANSEN , I. T. , 1966 , Electrical conductivity in evaporated silicon oxide films . Journal of Applied Physics , 37 , 499 – 507 .
  • LEWIS , A. , 1972 , Evidence for the Mott model of hopping conduction in the anneal stable state of amorphous silicon . Physics Review Letters , 29 , 1555 – 1558 .
  • MORLEY , A. R. , and CAMPBELL , D. S. , 1968 , Annealing behaviour in vacuum-deposited films of silicon oxide . Thin Solid Films , 2 , 403 – 411 .
  • PRIEST , J. , and CASWELL , H. L. , 1961 , Annealing of residual stress in silicon monoxide films . British Journal of Applied Physics , 12 , 580 – 581 .
  • RAHMAN , A. S. Md. S. , ISLAM , M. H. , and HOGARTH , C. A. , 1987 , AC electrical properties of vacuum-evaporated SiO/SnO2 films . International Journal of Electronics , 62 , 167 – 179 .
  • THEYE , M. L. , 1971 , Influence of annealing on the optical properties of amorphous germanium films . Material Research Bulletin , 6 , 103 – 118 .
  • TIMSON , P. A. , and HOGARTH , C. A. , 1971 , An electron spin resonance study of reactively evaporated SiO . Thin Solid Films , 8 , 237 – 243 .

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