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International Journal of Production Research Volume 42, 2004 - Issue 12
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Original Articles

Lower confidence bounds for CPU and CPL based on multiple samples with application to production yield assurance

W. L. Pearn Department of Industrial Engineering & Management, National Chiao Tung University, Taiwan, ROC
,
M. H. Shu Department of Commerce Automation & Management, National Pingtung Institute of Commerce, Taiwan, ROC
&
B. M. Hsu Department of Industrial Engineering and Management, Cheng Shiu University, Taiwan, ROC
Pages 2339-2356 | Published online: 21 Feb 2007

References

References

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  • Pearn , WL and Shu , MH . 2002 . An algorithm for calculating the lower confidence bounds of C PU and CPL with application to low-drop-out regulators . Microelectronics Reliability , 43 : 495 – 502 .
  • Pearn WL Shu MH Hsu BM 2003 Testing reliability assurance using capability indices CPU and CPL based on multiple samples with variable sample size. Working paper
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