References
- Ames , VA , Gililland , J , Konopka , J , Schnabl , R and Barber , K . 1995 . Semiconductor Manufacturing Productivity Overall Equipment Effectiveness (OEE) Guidebook International SEMATECH, Report Technology Transfer 95032745A-GEN
- Banks , J , Carson , JS and Nelson , BL . 2001 . Discrete Event System Simulation , NJ : Prentice-Hall . Upper Saddle River
- Bonal , J , Ortega , C , Rios , L , Aparicio , S , Fernandez , M , Rosendo , M , Sanchez , A and Malvar , S . 1996 . Overall fab efficiency Proceedings of the 7th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference Cambridge, MA , , USA
- Giegling , S , Verdini , WA , Haymon , T and Konopka , JM . 1997 . Implementation of overall equipment effectiveness (OEE) system at a semiconductor manufacturer, in Proceedings of the 1997 IEMT Symposium , TX , , USA : Austin .
- Hansen , RC . 2002 . Overall Equipment Effectiveness — A Powerful Production/Maintenance Tool for Increased Profits , New York , NY : Industrial Press .
- Huang , SH , Dismukes , JP , Shi , J , Su , Q , Razzak , MA , Bodhale , R and Robinson , DE . 2003 . Manufacturing productivity improvement using effectiveness metrics and simulation analysis . Int. J. Prod. Res. , 41 ( 3 ) : 513 – 527 .
- Huang , SH , Dismukes , JP , Shi , J , Su , Q , Wang , G , Razzak , MA and Robinson , DE . 2002 . Manufacturing system modeling for productivity improvement . J. Manuf. Sys. , 21 ( 4 ) : 249 – 259 .
- Jonsson , P and Lesshammar , M . 1999 . Evaluation and improvement of manufacturing performance measurement systems: the role of OEE . Int. J. Oper. Prod. Manag. , 19 ( 1 ) : 55 – 78 .
- Korgaonker , MG . 1992 . Just in Time Manufacturing , Bangalore : Macmillan India .
- Leachman , RC . 1997 . Closed-loop measurement of equipment efficiency and equipment capacity . IEEE Trans. Semiconduct. Manuf. , 10 ( 1 ) : 84 – 97 .
- Muthiah , KMN . 2003 . Diagnostic factory productivity metrics. MS thesis , University of Cincinnati .
- Muthiah , KMN and Huang , SH . 2006 . A review of literature on manufacturing systems productivity measurement and improvement . Int. J. Ind. Sys. Eng , 1 ( 4 )
- Nakajima , S . 1988 . Introduction to Total Productive Maintenance (TPM) , Cambridge , MA : Productivity Press .
- Scott , D and Pisa , R . 1998 . Can overall factory effectiveness prolong Moore's law? . Solid State Tech. , March : 75 – 82 .
- SEMI E124-0703 . 2003 . Provisional guide for definition and calculation of the overall factory efficiency (OFE) and other associated factory-level productivity metrics, in Semiconductor Equipment and Materials International
- SEMI E79-0200 . 2000 . Standard for definition and measurement of equipment productivity, in Semiconductor Equipment and Materials International