2
Views
0
CrossRef citations to date
0
Altmetric
Photographic Technology Supplement

“Sayee” Test Chart of Modified DesignFootnote

Pages 38-41 | Received 27 Oct 1976, Published online: 22 Jul 2016

References

  • Sayce, L. A., “The Measurement of Resolving Power”, Photogr, J., 80, 455 (1940).
  • See, for example, Maple, T. G., “Integrated Circuit Mask Fabrication” in S. L. Marshall (Ed.) Microelectronic Technology, Boston Technical Publishers (Cambridge, Mass.) (1967) p. 58.
  • Eastman Kodak Company. Techniques of Microphotography Industrial Data Book P-52 (Rochester, N.Y. 1963) p. 9.
  • Stevens, G. W. W., “Reproduction of Aerial Images of Different Sharpness on ‘Lith Type’ and Extreme-Resolution Emul-sions”, J. Photogr. Sci., 14, 153 (1966).

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.