1
Views
1
CrossRef citations to date
0
Altmetric
Original Articles

Conventional and Self-Developing Photothermoplastic Devices: Sensitivity and Rapid DevelopmentFootnote

&
Pages 183-188 | Received 24 Apr 1978, Published online: 22 Jul 2016

References

  • Glenn, W. E” J. appi. Phys., 30, 1870 (1959).
  • Linn, L. H. and Beauchamp, W. E., Appi. Optics, 9, 2088 (1970).
  • Credelle, T. L. and Spong, F. W., RCA Rev., 33, 206 (1972).
  • Colburn, W. S. and Tompkins, E. N., Appi. Optics, 13, 2934 (1974).
  • Killat, U. and Terrell, D. R., Optica Acta, 24, 441 (1977).
  • Gray, P. F. and Barnett, M. E., Opt. Commun., 12, 275 (1974).
  • Thinh, N. and Tanaka, S., Jap. J. appi. Phys., 12, 1954 (1973).
  • Butter, C. D. and Lee, T. C., IEEE Trans., C24, 402 (1975). Stewart, W. C., Mezrich, R. S., Cosentino, L. S., Nagle, E. M., Wendt, F. S. and Lohman, R. D., RCA Rev., 34, 3 (1973).
  • Terrell, D. R. and Killat, U., to be published.
  • Killat, U., Proc. Soc. Photo-opticaI Instr. Eng., 99, 144 (1977).
  • Budd, H. F., J. appi Phys., 36, 1613 (1965).
  • Killat, U"./. appi Phys., 46, 5169 (1975).
  • Kermisch, D” Appi Optics, 15, 1775 (1976).
  • Storck, E. and Wolff, U., Siemens Forsch, u. Entwickl. Ber., 6, 63 (1977).
  • See, for example, Ferry, J. D., Viscoelastic Properties of Polymers, 2nd ed., Wiley, New York (1970).
  • Krumme, J.-P., Heitmann, H., Mateika, B. and Witter, K., J. appi Phys., 48, 366 (1977).

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.