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The Journal of Photographic Science Volume 26, 1978 - Issue 6

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Photographic Technology Supplement

Quantitative Examination of Photofabricated Profiles. Part 3. Measurement of Etch FactorFootnote
Some authors have used the inverse function (undercut/depth) but the form chosen here has the logical advantage of high etch factors indicating good performance.

D. M. AllenSchool of Production Studies, Cranfield Institute of Technology, Cranfield, Bedford MK43

D. F. HorneSchool of Production Studies, Cranfield Institute of Technology, Cranfield, Bedford MK43

G. W. W. StevensSchool of Production Studies, Cranfield Institute of Technology, Cranfield, Bedford MK43

Pages 242-245 | Received 15 Aug 1978, Published online: 22 Jul 2016

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https://doi.org/10.1080/00223638.1978.11738002

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Allen, D. M., Horne, D. F. and Stevens, G. W. W. “Quanti-tative examination of photofabricated profiles”, Part 1, J. photogr. Sci., 25, 254 (1977); Part 2, J. photogr. Sci., 26, 72 (1978).
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Allen, D. M., Horne, D. F. and Stevens, G. W. W. “Preparation of specimens for microscopic examination of edge profiles”, J Microsc., Ill, 203 (1977).
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Crandall, K. C. and Seabloom, R. W., Engineering Funda-mentals in Measurements, Probability, Statistics and Di-mensions, McGraw-Hill, New York (1970), Ch. 6-4.
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