References
Periodicals
- Bromer, J., “A Logical Approach to Testing IC's,” Electronic Products, August 1969.
- Kidwell, J. L., “The Inspector—A Critical Factor in the Reliability Equation,” Industrial Quality Control, September 1965.
- Seiden, N., “Reliability Through Redundancy,” Electronic Products, July 1965.
Books
- Bazovsky, Igor, Reliability Theory and Practice, Prentice-Hall, Englewood Cliffs, N.J., 1961.
Company and Government Reparts
- Advisory Group on Reliability of Electronic Equipment Report, “Reliability of Military Electronic Equipment,” June 4, 1957.
- Cozzolino, J. M., “The Optimal Burn-In Testing of Repairable Equipment,” Technical Report No. 28, MIT Operations Research Center, Cambridge, Mass., October 1966.
- Electronic Industries Association, “Equipment Burn-In,” Reliability Bulletin No. 8, May 1971.
- Shamash, M. B., “Development of Highly Reliable Soldered Joints for Printed Circuit Boards,” Report No. 8402A, Westinghouse Defense and Space Center, Baltimore, Md., August 1968.
Transactions and Proceedings
- General Dynamics/Fort Worth Division, “Proceedings of the F-111 Reliability Seminar,” Document QA310, Fort Worth, Texas, October 31, 1967.
- Lyman, K. A., “A Unifying Reliability Analysis Philosophy,” Proceedings: 1970 Symposium on Reliability, pp. 221–227.
- Moller, F., “Reliability and other Accelerated Testing Techniques,” 1971 ASQC All-Day Forum Transactions, Montreal, Canada, October 1971.
- Scianna, N. A., “Piece Part Screening to Enhance Reliability,” Document SI-384, 1968 Joint Meeting IEEE—ASQC, Harpur College, Binghampton, N.Y.
- Sessen, L., “Reliability Testing: Uniformity Efficiency and Economy Needed,” Proceedings: 1970 Annual Symposium on Reliability, pp. 212–220.
- Stokes, R. G., and Steele, F. N., “Some Life-Cycle Estimates for Electronic Equipment: Methods and Results,” Proceedings: 1968 Annual Symposium on Reliability, pp. 27–33.
- Vander Hamm, R. L., “Environmental Testing—The Key to High Reliability,” Proceedings: 1969 Annual Symposium on Reliability, pp. 27–33.
Standards
- MIL-STD-781B, “Reliability Tests, Exponential Distribution,” Department of Defense, Bureau of Naval Weapons, Department of the Navy, Washington, D.C., November 15, 1967.