Publication Cover
Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 12, 1980 - Issue 2
5
Views
4
CrossRef citations to date
0
Altmetric
Reviews of Standards and Specifications

MIL-STD-781 and Confidence Intervals

Pages 98-105 | Published online: 22 Feb 2018

References

  • Aroian, L. A., “Application of the Direct Method in Sequential Analysis,” Technometrics, Vol. 18, No. 3, 1976, pp. 301–306.
  • Aroian, L. A. and Oksoy, D., “Estimation, Confidence Intervals, and Incentive Plans for Sequential Three-Way Decision Procedures,” 1972 NATO Conference Proceedings on Reliability Testing and Evaluation, VI-D-1 to VI-D-13.
  • Bryant, C. and Schmee, J., “Confidence Limits on MTBF for Sequential Test Plans of MIL-STD-781,” Technometrics, Vol. 21, No. 1, 1979, pp. 33–42.
  • Epstein, B., “Estimation from Life Test Data,” Technometrics, Vol. 2, No. 4, 1960, pp. 447–454.
  • Fairbanks, V. B., “Two-Sided Confidence Intervals for an Exponential Parameter,” Technical Report No. 73, Department of Statistics, University of Missouri-Columbia, January 1978.
  • Harter, H. L., “New Tables of the Incomplete Gamma Function Ratio and of Percentage Points of the Chi-Square and Beta Distribution,” U.S. Government Printing Office, Washington, D.C., 1964.
  • Harter, H. L., “MTBF Confidence Bounds Based on MIL-STD-781C Fixed-Length Test Results,” Journal of Quality Technology, Vol. 10, No. 4, 1978, pp. 164–169.
  • Luetjen, P., “Tables of Parametric Confidence Limits from Hypothesis Test Data,” NAVSEC Report 6112-75-1, Naval Ship Engineering Center, Hyattsville, Maryland, 1974.
  • MIL-STD-781C, “Military Standard Reliability Qualification on Production Acceptance Tests: Exponential Distribution,” Washington, D.C., 1977.
  • Neathammer, R. D., Pabst, W. R., and Wigginton, C. G., “MIL-STD-781B, Reliability Tests: Exponential Distribution,” Journal of Quality Technology, Vol. 1, No. 1, 1969, pp. 58–67.
  • Schmee, J., “MIL-STD-781C and Confidence Intervals on Mean Time Between Failures,” Union College, Schenectady, AES Monograph, 7905.
  • Sumerlin, W. T., “Confidence Calculations for MEL-STD-781,” 1972 Annual Reliability and Maintainability Symposium, IEEE Catalog Number 72CH0577-B, January 1972, pp. 205–121.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.