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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 12, 1980 - Issue 3
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Articles

A Nomogram for Estimating the Three Parameters of the Weibull Distribution

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Pages 138-143 | Published online: 22 Feb 2018

References

  • Gumbel, E. J., Statistics of Extremes, Columbia University Press, New York, 1967, pp. 276–285.
  • Harter, H. L. and Moore, A. H., “Maximum Likelihood Estimation of the Parameters of Gamma and Weibull Population from Complete and Censored Samples,” Technometrics, Vol. 7, No. 4, 1965, pp. 639–643.
  • Kao, J. H. K., “Computer Methods for Estimating Weibull Parameters in Reliability Studies,” Institute of Radio Engineers Transactions on Reliability and Quality Control, Vol. PGRQC-13, No. 3, 1958, pp. 15–22.
  • Kendall, M. G. and Stuart, A., The Advanced Theory of Statistics, Vol. 2, Charles Griffin and Company, London, 1961, pp. 65–67.
  • Lehman, E. H., Jr., “Shapes, Moments and Estimators of the Weibull Distribution,” Institute of Electrical and Electronics Engineers Transactions on Reliability, Vol. R-12, No. 3, 1963, pp. 32–38.
  • Ringer, L. J. and Sprinkle, E. E., “Estimation of the Parameters of the Weibull Distribution from Multicensored Samples,” Institute of Electrical and Electronics Engineers Transactions on Reliability, Vol. R-21, No. 1, 1972, pp. 46–51.
  • Seinfeld, J. H. and Lapidus, L., Mathematical Methods in Chemical Engineering, Vol. 3, Prentice Hall, Englewood Cliffs, New Jersey, 1974, pp. 382–392.
  • Weibull, W., “A Statistical Distribution Function of Wide Applicability,” Journal of Applied Mechanics, Vol. 18, No. 3, 1951, pp. 293–297.
  • Wingo, D. R., “Maximum Likelihood Estimation of the Parameters of the Weibull Distribution by Modified Quasilinearization,” Institute of Electrical and Electronics Engineers Transactions on Reliability, Vol. R-21, No. 2, 1972, pp. 89–92.
  • Wingo, D. R., “Solution of the Three-Parameter Weibull Equation by Constrained Modified Quasilinearization (Progressively Censored Samples),” Institute of Electrical and Electronics Engineers Transactions on Reliability, Vol. R-22, No. 2, 1973, pp. 96–102.

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