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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 17, 1985 - Issue 2
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Articles

Approximately Optimal Narrow Limit Gauges

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Pages 63-66 | Published online: 22 Feb 2018

References

  • Beja, A., and Ladany, S. P. (1974). “Efficient Sampling Plans by Attributes”. Technometrics 16, pp. 601–611.
  • David, H. A. (1981). Order Statistics, 2nd edition. John Wiley and Sons, Inc., New York, NY.
  • Ladany, S. P. (1976). “Determination of Optimal Compressed Limit Gauging Sampling Plans”. Journal of Quality Technology 8, pp. 225–231.
  • Ott, E. R., and Mundel, A. B. (1954). “Narrow Limit Gauging”. Industrial Quality Control 10, pp. 21–28.
  • Schilling, E. G., and Sommers, D. J. (1981). “Two-Point Optimal Narrow Limit Plans with Applications to MIL-STD-105D”. Journal of Quality Technology 13, pp. 83–92.
  • Sykes, J. (1981). “A Nomogram to Simplify the Choice of Sample Plan Using a Single Gauge”. Journal of Quality Technology 13, pp. 36–41.

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