Additional References
- Hong, Y. and Meeker, W. Q. (2013). “Field-Failure Predictions Based on Failuretime Data with Dynamic Covariate Information”. Technometrics 55, to appear.
- Li, M. and Meeker, W. Q. (2013). “Application of Bayesian Methods in Reliability Data Analyses”. Journal of Quality Technology 45, pp. xx–xx.
- Ma, H. and Meeker, W. Q. (2008). “Optimum Step-Stress Accelerated Life Test Plans for Log-Location-Scale Distributions”. Naval Research Logistics 55, pp. 551–562.
- Meeker, W. Q. (1987). “Limited Failure Population Life Tests: Application to Integrated Circuit Reliability”. Technometrics 29, pp. 151–165.
- Meeker, W. Q. and LuValle, M. J. (1995). “An Accelerated Life Test Model Based on Reliability Kinetics”. Technometrics 37, pp. 133–146.