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Volume 112, 2014 - Issue 7

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Research Article

Internal (SiH)_X groups, X = 1–4, in microcrystalline hydrogenated silicon and their IR spectra on the basis of periodic DFT modelling

Alexander V. LarinDepartment of Chemistry, Moscow State University, Moscow119992, Russia;OOO Plasmonika, Skolkovo Startup Village, Moscow RegionRussia143025, RussiaCorrespondence[email protected]

Dar’ya V. MilyaevaDepartment of Chemistry, Moscow State University, Moscow119992, Russia

Andrey A. RybakovDepartment of Chemistry, Moscow State University, Moscow119992, Russia

Dmitrii S. BezrukovDepartment of Chemistry, Moscow State University, Moscow119992, Russia

Dmitrii N. TrubnikovDepartment of Chemistry, Moscow State University, Moscow119992, Russia

Pages 956-962 | Received 23 Apr 2013, Accepted 17 Jun 2013, Published online: 06 Aug 2013

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https://doi.org/10.1080/00268976.2013.817621
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Internal (SiH)_X groups, X = 1–4, in microcrystalline hydrogenated silicon and their IR spectra on the basis of periodic DFT modelling

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Internal (SiH)X groups, X = 1–4, in microcrystalline hydrogenated silicon and their IR spectra on the basis of periodic DFT modelling

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Internal (SiH)_X groups, X = 1–4, in microcrystalline hydrogenated silicon and their IR spectra on the basis of periodic DFT modelling