40
Views
50
CrossRef citations to date
0
Altmetric
Original Articles

Approximations to the Average Run Length in Cumulative Sum Control Charts

Pages 65-71 | Published online: 09 Apr 2012

References

  • Anderson , T. W. 1960 . A Modification of the Sequential Probability Ratio Test to Reduce the Sample Size . Ann. Math. Statist. , 31 : 165 – 197 .
  • Bagshaw , M. and Johnson , R. A. 1975 . The Effect of Serial Correlation on the Performance of Cusum Tests II . Technometrics , : 17
  • Barnard , G. A. 1959 . Control Charts and Stochastic Processes . J. Roy. Statist. Soc, B , 21 : 239 – 271 .
  • Billingsley , P. 1968 . Convergence of Probability Measures. New York : Wiley. .
  • Darling , D. A. and Siegebt , A. J. F. 1953 . The First Passage Problem for a Continuous Markov Process . Ann. Math. Statist. , 24 : 624 – 639 .
  • Van Dobben de Bruyn , C. S. 1968 . Cumulative Sum Tests New York : Hafner. .
  • Donsker , M. D. 1951 . An Invariance Principal for Certain Probability Limit Theorems . Mem. Amer. Math. Soc. , : 6
  • Ewan , W. D. 1963 . When and How to Use Cu-sum Charts . Technometrics , 5 : 1 – 22 .
  • Ewan , W. D. and Kemp , K. W. 1960 . Sampling Inspection of Continuous Processes with no Autocorrelation Between Successive Results . Biometrika , 47 : 363 – 380 .
  • Goldsmith , R. L. and Whitfield , H. 1961 . Average Run Lengths in Cumulative Chart Quality Control Schemes . Technometrics , 3 : 11 – 20 .
  • Johnson , N. L. 1961 . Simple Theoretical Approach to Cumulative Sum Control Charts . J. Amer. Statist Assoc , 56 : 835 – 840 .
  • Kemp , K. W. 1961 . The Average Run Length of the Cumulative Sum Chart when a V-mask is used . J. Roy. Statist. Soc, B , 23 : 149 – 153 .
  • Nadler , Jack and Robbins , Naomi B. 1971 . Some Characteristics of Page's Two-Sided Procedure for Detecting a Change in a Location Parameter . Ann. Math. Statist , 42 : 538 – 551 .
  • Page , E. S. 1954 . Continuous Inspection Schemes . Biometrika , 41 : 100 – 114 .
  • Page , E. S. 1961 . Cumulative Sum Charts . Technometrics , 3 : 1 – 9 .
  • Reynolds , M. R. Jr. 1972 . A Sequential Nonparametric Test for Symmetry with Applications to Process Control Dept. of Op. Res. and Dept. of Statist., Stanford University. . Tech. Report No. 148
  • Shewhart , W. A. 1931 . The Economic Control of Quality of Manufactured Product. New York : Von Nostrand. .
  • Traux , H. M. 1961 . Cumulative Sum Charts and Their Application to the Chemical Industry . Industrial Quality Control , 18 : 18 – 25 .
  • Wald , A . 1947 . Sequential Analysis. New York : Wiley. .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.