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Technometrics Volume 35, 1993 - Issue 2
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Original Articles

Detecting Spatial Effects From Factorial Experiments: An Application From Integrated-Circuit Manufacturing

Winson Taam Department of Mathematical Sciences, Oakland University, Rochester, MI, 48309-4401
&
Michael Hamada Department of Statistics and Actuarial Science and The Institute for Improvement in Quality and Productivity, University of Waterloo, Waterloo, Ontario, N2L 3Gl, Canada
Pages 149-160 | Published online: 12 Mar 2012

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