688
Views
97
CrossRef citations to date
0
Altmetric
Original Articles

Statistical Inference of a Time-to-Failure Distribution Derived From Linear Degradation Data

, &
Pages 391-400 | Published online: 12 Mar 2012

REFERENCES

  • Ahmad , M. and Sheikh , A. K. 1984 . “Bernstein Reliability Model: Derivation and Estimation of Parameters,” . Reliability Engineering , 8 : 131 – 148 .
  • Boulanger , M. and Escobar , L. A. 1994 . “Experimental Design for a Class of Accelerated Degradation Tests,” . Technometrics , 36 : 260 – 272 .
  • Box , G. E. P. and Cox , D. R. 1964 . “An Analysis of Transformations” (with discussion) . Journal of the Royal Statistical Society, Ser. B , 26 : 211 – 252 .
  • Carey , M. B. and Tortorella , M. “Analysis of Degradation Data Applied to MOS Devices,” . paper presented at the 6th International Conference on Reliability and Maintainability . Strasbourg , France.
  • Chen , K. L. , Saller , S. A. , Groves , I. A. and Scott , D. B. 1985 . “Reliability Effects on MOS Transistors Due to Hot-Carrier Injection,” . IEEE Transactions on Electron Devices , 32 : 386 – 393 .
  • Chi , E. M. and Reinsel , G. C. 1989 . “Models for Longitudinal Data With Random Effects and AR(1) Errors,” . Journal of the American Statistical Association , : 452 – 459 .
  • Chung , J. E. , Ko , P. K. and Hu , C. 1991 . “A Model for Hot-Electron-induced MOSFET Linear Current Degradation Based on Mobility Reduction Due to Interface-State Generation,” . IEEE Transactions on Electron Devices , 38 : 1362 – 1370 .
  • Davidian , M. and Carroll , R. J. 1987 . “Variance Function Estimation,” . Journal of the American Statistical Association , 82 : 1079 – 1091 .
  • Davidian , M. and Gallant , A. R. 1993 . “The Nonlinear Mixed Effects Model With a Smooth Random Effects Density,” . Biometrika , 80 : 475 – 488 .
  • Davidian , M. and Giltinan , D. M. 1993 . “Some Simple Methods for Estimating Intraindividual Variability in Nonlinear Mixed Effects Models,” . Biometrics , 49 : 59 – 73 .
  • Efron , B. 1985 . “Bootstrap Confidence Intervals for a Class of Parametric Problems,” . Biometrika , 72 : 45 – 58 .
  • Efron , B. 1987 . “Better Bootstrap Confidence Intervals,” . Journal of the American Statistical Association , 82 : 171 – 185 .
  • Einspruch , E. and Gildenblat , G. 1989 . VLSI Electronics: Microstructure Science Vol. 18 , New York : Academic Press. .
  • Gertsbakh , I. B. and Kordonskiy , K. B. 1969 . Models of Failure New York : Springer-Verlag. . (translated from Russian)
  • Howes , M. J. and Morgan , D. V. 1981 . Reliability and Degradation Semiconductor Devices and Circuits New York : Wiley. .
  • Hsu , F. C. and Tam , S. 1984 . “Relationship Between MOSFET Degradation and Hot-Electron-Induced Interface-State Generation,” . IEEE Electron Device Letters , 5 : 50 – 55 .
  • IMSL . 1987 . STAT/Library: Fortran Subroutines for Statistical Analysis Houston : Problem-Solving Software Systems. .
  • Lawless , J. F. 1982 . Statistical Models and Methods for Lifetime Data New York : Wiley. .
  • Leblebici , Y. and Kang , S. M. 1992 . “Modeling and Simulation of Hot-Carrier Induced Device Degradation in MOS Circuits,” University of Illinois at Urbana-Champaign, Dept. of Electrical and Computer Engineering. . research report
  • Lindstrom , M. J. and Bates , D. M. 1988 . “Newton-Raphson and EM Algorithms for Linear Mixed-Effects Models for Repeated Measures Data,” . Journal of the American Statistical Association , 83 : 1014 – 1022 .
  • Lu , J. C. 1989 . “Weibull Extensions of the Freund and Marshall–Olkin Bivariate Exponential,” . IEEE Transactions on Reliability , 38 ( 5 ) : 615 – 619 .
  • Lu , J. C. and Bhattacharyya , G. K. 1990 . “Some New Constructions of Bivariate Weibull Models,” . Annals of the Institute of Statistical Mathematics , 42 : 543 – 559 .
  • Lu , C. J. and Meeker , W. Q. Jr. 1993 . “Using Degradation Measures to Estimate a Time-To-Failure Distribution,” . Technometrics , 35 : 161 – 174 .
  • Mohamedi , S. Z. , Chan , V. H. , Park , J. T. , Nouri , F. , Scharf , B. W. and Chung , J. E. 1992 . “Hot-Electron-Induced Input Offset Voltage Degradation in CMOS Differential Amplifiers,” Massachusetts Institute of Technology, Dept. of Electrical and Computer Sciences. . research report
  • Nair , V. N. 1988 . Discussion of “Estimation of Reliability in Field-Performance Studies,” . Technometrics , 30 : 379 – 383 . by J. D. Kalbfleisch and J. F. Lawless
  • Nelson , W. 1984 . “Fitting of Fatigue Curves With Nonconstant Standard Deviation to Data With Runouts,” . Journal of Testing and Evaluation , 12 : 69 – 77 .
  • Nelson , W. 1990 . Accelerated Testing: Statistical Methods, Test Plans, and Data Analysis New York : Wiley. .
  • Olson , H. M. 1978 . “Device Technology,”. ” . In Variable Impedance Devices Edited by: Howes , M. J. and Morgan , D. V. 75 – 153 . New York : Wiley. .
  • Poate , J. M. , Tu , K. N. and Mayer , J. W. 1978 . Thin Films—Interdiffusion and Reactions New York : Wiley. .
  • Powell , M. J. D. 1964 . “An Efficient Method for Finding the Minimum of a Function of Several Variables Without Calculating Derivatives,” . Computer Journal , 7 : 155 – 162 .
  • Quader , K. N. , Ko , P. K. , Hu , C. , Fang , P. and Yue , J. T. 1992 . “Simulation of CMOS Circuit Degradation Due to Hot-Carrier Effects,” Sunnyvale , CA : University of California, Berkeley, Dept. of Electrical Engineering and Computer Sciences, and Advanced Micro Devices, Inc. . research report
  • Rochon , J. 1992 . “ARMA Covariance Structures With Time Heteroscedasticity for Repeated Measures Experiments,” . Journal of the American Statistical Association , 87 : 777 – 784 .
  • SAS . 1990 . A system of software providing control over data access, management, analysis, and presentation Cary , NC : SAS Institute. .
  • Stinebaugh , W. H. Jr. , Harrus , A. and Knolle , W. R. 1989 . “Correlation of Gm Degradation of Submicrometer MOSFET's With Refractive Index and Mechanical Stress of Encapsulation Materials,” . IEEE Transactions on Electron Devices , 36 : 542 – 547 .
  • Suzuki , K. , Maki , K. and Yokogawa , S. 1993 . “An Analysis of Degradation Data of a Carbon Film and the Properties of the Estimators,”. ” . In Statistical Science and Data Analysis Edited by: Matusita , K. , Puri , M. L. and Hayakawa , T. 501 – 511 . Utrecht , , the Netherlands : VSP. .
  • Takeda , E. and Suzuki , N. 1983 . “An Empirical Model for Device Degradation Due to Hot-Carrier Injection,” . IEEE Electron Device Letters , 4 : 111 – 113 .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.