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Original Articles

Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models

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Pages 244-254 | Received 01 Oct 2013, Published online: 18 Apr 2016

REFERENCES

  • Bigi, G., and Castellani, M. (2004), “Uniqueness of KKT Multipliers in Multi-Objective Optimization,” Applied Mathematics Letters, 17, 1285–1290.
  • Boulanger, M., and Escobar, L.A. (1994), “Experimental Design for a Class of Accelerated Degradation Tests,” Technometrics, 36, 260–272.
  • Chernoff, H. (1962), “Optimal Accelerated Life Designs for Estimation,” Technometrics, 4, 381–408.
  • Corless, R., Gonnet, G., Hare, D., Jeffrey, D., and Knuth, D.E. (1996), “On the Lambert W Function,” Advances in Computational Mathematics, 5, 329–359.
  • Hsieh, M.H., and Jeng, S.L. (2007), “Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides,” IEEE Transactions on Reliability, 56, 369–380.
  • Jørgensen, B. (1997), Theory of Dispersion Models, London: Chapman & Hall.
  • Lawless, J., and Crowder, M. (2004), “Covariates and Random Effects in a Gamma Process Model with Application to Degradation Failure,” Lifetime Data Analysis, 19, 213–227.
  • Lim, H., and Yum, B.J. (2011), “Optimal Design of Accelerated Degradation Tests Based on Wiener Process Models,” Journal of Applied Statistics309–325.
  • Liu, X, and Tang, L.C. (2010), “A Bayesian Optimal Design for Accelerated Degradation Tests,” Quality and Reliability Engineering International, 26, 863–875.
  • Meeker, W.Q. (1984), “A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring,” Technometrics, 26, 157–171.
  • Meeker, W.Q., and Escobar, L.A. (1998), Statistical Methods for Reliability Data, New York: Wiley.
  • Meeker, W.Q., Escobar, L.A., and Lu, C.J. (1998), “Accelerated Degradation Tests: Modeling and Analysis,” Technometrics, 40, 89–99.
  • Meeker, W.Q., and Hahn, G.J. (1977), “Asymptotically Optimum Over-stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability” (with discussion), Technometrics, 19, 381–404.
  • ——— (1985), How to Plan an Accelerated Life Test: Some Practical Guidelines, Milwaukee, WI: American Society for Quality Control.
  • Myers, R.H., Montgomery, D.C., and Anderson-Cook, C.M. (2009), Response Surface Methodology: Process and Product Optimization Using Designed Experiments, New Jersey: Wiley.
  • Nelson, W. (2004), Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, New York: Wiley.
  • Padgett, W.J., and Tomlinson, M.A. (2004), “Inference from Accelerated Degradation and Failure Data Based on Gaussian Process Models,” Lifetime Data Analysis, 10, 191–206.
  • Park, C., and Padgett, W.J. (2005). “Accelerated Degradation Models for Failure Based on Geometric Brownian Motion and Gamma Process,” Lifetime Data Analysis, 11, 511–527.
  • Peng, C.Y. (2012). “A Note on Optimal Allocations for the Second Elementary Symmetric Function with Applications for Optimal Reliability Design,” Naval Research Logistics, 59, 278–284.
  • Pettit, L.I., and Young, K.D. S. (1999), ‘‘Bayesian Analysis for Inverse Gaussian Lifetime Data with Measures of Degradation,’’ Journal of Statistical Computation and Simulation, 63, 217–234.
  • R Development Core Team (2013), R: A Language and Environment for Statistical Computing, Vienna, Austria: R Foundation for Statistical Computing. Available at http://www.R-project.org.
  • SAS Institute Inc. (2012), Using JMP 10, Cary, NC: SAS Institute Inc.
  • Shi, Y., Escobar, L.A., and Meeker, W.Q. (2009), “Accelerated Destructive Degradation Test Planning,” Technometrics, 51, 1–13.
  • Shi, Y., and Meeker, W.Q. (2012), “Bayesian Methods for Accelerated Destructive Degradation Test Planning,” IEEE Transactions on Reliability, 61, 245–253.
  • Singpurwalla, N.D. (1995), “Survival in Dynamic Environments,” Statistical Science, 10, 86–103.
  • Tang, L.C., and Chang, D.S. (1995), “Reliability Prediction using Nondestructive Accelerated-Degradation Data–Case Study on Power Supplies,” IEEE Transactions on Reliability, 44, 562–566.
  • Tsai, C.C., Tseng, S.T., and Balakrishnan, N. (2012), “Optimal Design for Degradation Tests Based on Gamma Processes with Random Effects,” IEEE Transactions on Reliability, 61, 604–613.
  • Tseng, S.T., Tsai, C.C., and Balakrishnan, N. (2011), “Optimal Sample Size Allocation for Accelerated Degradation Test Based on Wiener Process,” in Methods and Applications of Statistics in Engineering, Quality Control, and the Physical Sciences, ed. N. Balakrishnan, Hoboken, NJ: Wiley, pp. 330–343.
  • Tweedie, M.C. K. (1984), “An Index Which Distinguishes Between Some Important Exponential Families,” in Statistics: Applications and New Directions. Proceedings of the Indian Statistical Institute Golden Jubilee International Conference, eds. J.K. Ghosh and J. Roy, Calcutta: Indian Statistical Institute, pp. 579–604.
  • Wang, X., and Xu, D. (2010), “An Inverse Gaussian Process Model for Degradation Data,” Technometrics, 52, 188–197.
  • Yang, G. (2007), Life Cycle Reliability Engineering, Hoboken, NJ: Wiley.
  • Ye, Z.S., and Chen, N. (2014), “The Inverse Gaussian Process as a Degradation Model,” Technometrics, 56, 302--311.
  • Ye, Z.S., Chen, L.P., Xie, M., and Tang, L.C. (2014), “Accelerated Degradation Test Planning Using the Inverse Gaussian Process,” IEEE Transactions on Reliability, 63, 750--763.
  • Yu, H.F., and Tseng, S.T. (1999), “Designing a Degradation Experiment,” Naval Research Logistics, 46, 689–706.
  • Yum, B.J., Lim, H., and Seo, S.K. (2007), “Planning Performance Degradation Tests—A Review,” International Journal of Industrial Engineering: Applications and Practice, 14, 372–381.

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