Using a novel approach to assess process performance in the presence of measurement errors

References

• Kane , V. E. 1986 . Process capability indices . J. Qual. Technol , 18 : 41 – 52 .
   Web of Science ®Google Scholar
• Pearn , W. L. , Lin , G. H. and Chen , K. S. 1998 . Distributional and inferential properties of process accuracy and process precision indices . Comm. Statist. Theory Methods , 27 ( 4 ) : 985 – 1000 .
   Web of Science ®Google Scholar
• Boyles , R. A. 1991 . The Taguchi capability index . J. Qual. Technol , 23 : 17 – 26 .
   Web of Science ®Google Scholar
• Kotz , S. and Johnson , N. L. 1993 . Process Capability Indices , London : Chapman & Hall .
   Google Scholar
• Kotz , S. and Lovelace , C. 1998 . Process Capability Indices in Theory and Practice , London, , UK : Arnold .
   Google Scholar
• Kotz , S. and Johnson , N. L. 2002 . Process capability indices – A review, 1992–2000 . J. Qual. Technol , 34 ( 1 ) : 1 – 19 .
   Web of Science ®Google Scholar
• Spiring , F. , Leung , B. , Cheng , S. and Yeung , A. 2003 . A bibliography of process capability papers . Qual. Reliab. Eng. Int , 19 ( 5 ) : 445 – 460 .
   Web of Science ®Google Scholar
• Chou , Y.-M. , Owen , D. B. and Borrego , S. A. 1990 . Lower confidence limits on process capability indices . J. Qual. Technol , 22 : 223 – 229 .
   Web of Science ®Google Scholar
• Chou , Y.-M. and Polansky , A. M. 1993 . Power of tests of some process capability indices . Comm. Statist. Simulation Comput , 22 : 523 – 544 .
   Web of Science ®Google Scholar
• Hoffman , L. L. 2001 . Obtaining confidence intervals for Cpk using percentiles of the distribution of Cp . Qual. Reliab. Eng. Int , 17 ( 2 ) : 113 – 118 .
   Web of Science ®Google Scholar
• Wu , C. W. and Pearn , W. L. 2005 . Capability testing based on Cpm with multiple samples . Qual. Reliab. Eng. Int , 21 ( 1 ) : 29 – 42 .
   Web of Science ®Google Scholar
• Wu , C. W. 2007 . An alternative approach to test process capability for unilateral specification with subsamples . Int. J. Prod. Res , 45 ( 22 ) : 5397 – 5415 .
   Web of Science ®Google Scholar
• Wu , C. W. 2008 . Assessing process capability based on Bayesian approach with subsamples . Eur. J. Oper. Res , 184 ( 1 ) : 207 – 228 .
   Web of Science ®Google Scholar
• Wu , C. W. , Pearn , W. L. and Kotz , S. 2009 . An overview of theory and practice on process capability indices for quality assurance . Int. J. Prod. Econ , 117 ( 2 ) : 338 – 359 .
   Web of Science ®Google Scholar
• Montgomery , D. C. and Runger , G. C. 1993 . Gauge capability and designed experiments. Part I: basic methods . Qual. Eng , 6 ( 1 ) : 115 – 135 .
   Google Scholar
• Mittag , H. J. Measurement error effects on the performance of process capability indices . Paper presented at the 5th International Workshop on Intelligent Statistical Quality Control . Osaka, Japan.
   Google Scholar
• Mittag , H. J. 1997 . Measurement error effects on the performance of process capability indices . Front. Statist. Qual. Control , 5 : 195 – 206 .
   Google Scholar
• Levinson , W. A. 1995 . How good is your gauge? . Semicond. Int , : 165 – 168 . October
   Google Scholar
• Bordignon , S. and Scagliarini , M. 2002 . Statistical analysis of process capability indices with measurement errors . Qual. Reliab. Eng. Int , 18 : 321 – 332 .
   Web of Science ®Google Scholar
• Scagliarini , M. 2002 . Estimation of Cp for autocorrelated data and measurement errors . Comm. Statist. Theory Methods , 31 : 1647 – 1664 .
   Web of Science ®Google Scholar
• Bordignon , S. and Scagliarini , M. 2006 . Estimation of Cpm when measurement error is present . Qual. Reliab. Eng. Int , 22 ( 7 ) : 787 – 801 .
   Web of Science ®Google Scholar
• Pearn , W. L. and Liao , M. Y. 2005 . Measuring process capability based on Cpk with gauge measurement errors . Microelectron. Reliab , 45 : 739 – 751 .
   Web of Science ®Google Scholar
• Weerahandi , S. 1993 . Generalized confidence intervals . J. Amer. Statist. Assoc , 88 : 899 – 905 .
   Web of Science ®Google Scholar
• Hamada , M. and Weerahandi , S. 2000 . Measurement system assessment via generalized inference . J. Qual. Technol , 32 ( 3 ) : 241 – 253 .
   Web of Science ®Google Scholar
• Chang , Y. P. and Huang , W. T. 2000 . Generalized confidence intervals for the largest value of some functions of parameters under normality . Statist. Sinica , 5 : 805 – 820 .
   Google Scholar
• Chiang , A. K.L. 2001 . A simple general method for constructing confidence intervals for functions of variance components . Technometrics , 43 : 356 – 367 .
   Web of Science ®Google Scholar
• Krishnamoorthy , K. and Mathew , T. 2004 . One-sided tolerance limits in balanced and unbalanced one-way random models based on generalized confidence intervals . Technometrics , 46 : 44 – 52 .
   Web of Science ®Google Scholar
• Mathew , T. and Webb , D. W. 2005 . Generalized p values and confidence intervals for variance components: Applications to army testing and evaluation . Technometrics , 47 : 312 – 322 .
   Web of Science ®Google Scholar
• Kurian , K. M. , Mathew , T. and Sebastian , G. 2008 . Generalized confidence intervals for process capability indices in the one-way random model . Metrika , 67 ( 1 ) : 83 – 92 .
   Web of Science ®Google Scholar
• H.K. Iyer and P. Patterson, A recipe for constructing generalized pivotal quantities and generalized confidence intervals, Tech. Rep. 2002-10, Department of Statistics, Colorado State University, 2002. Available at http://www.stat.colostate.edu/research/2002_10.pdf
   Google Scholar
• Chou , Y.-M. and Owen , D. B. 1989 . On the distributions of the estimated process capability indices . Comm. Statist. Theory Methods , 18 : 4549 – 4560 .
   Web of Science ®Google Scholar
• Pearn , W. L. , Kotz , S. and Johnson , N. L. 1992 . Distributional and inferential properties of process capability indices . J. Qual. Technol , 24 ( 4 ) : 216 – 233 .
   Web of Science ®Google Scholar
• Pearn , W. L. and Lin , P. C. 2004 . Testing process performance based on the capability index Cpk with critical values . Comput. Ind. Eng , 47 : 351 – 369 .
   Web of Science ®Google Scholar
• Franklin , L. A. and Wasserman , G. S. 1991 . Bootstrap confidence interval estimates of Cpk: An introduction . Comm. Statist. Simulation Comput , 20 : 231 – 242 .
   Web of Science ®Google Scholar
• Franklin , L. A. and Wasserman , G. S. 1992 . Bootstrap lower confidence limits for capability indices . J. Qual. Technol , 24 ( 4 ) : 196 – 210 .
   Web of Science ®Google Scholar
• Kushler , R. H. and Hurley , P. 1992 . Confidence bounds for capability indices . J. Qual. Technol , 24 ( 4 ) : 188 – 195 .
   Web of Science ®Google Scholar
• Tang , L. C. , Than , S. E. and Ang , B. W. 1997 . A graphical approach to obtaining confidence limits of Cpk . Qual. Reliab. Eng. Int , 13 : 337 – 346 .
   Web of Science ®Google Scholar
• Vännman , K. 1997 . Distribution and moments in simplified form for a general class of capability indices . Comm. Statist. Theory Methods , 26 : 159 – 179 .
   Web of Science ®Google Scholar
• Pearn , W. L. , Shu , M. H. and Hsu , B. M. 2005 . Testing process capability based on Cpm in the presence of random measurement errors . J. Appl. Stat , 32 ( 10 ) : 1003 – 1024 .
   Web of Science ®Google Scholar
• Mathew , T. , Sebastian , G. and Kurian , K. M. 2007 . Generalized confidence intervals for process capability indices . Qual. Reliab. Eng. Int , 23 ( 4 ) : 471 – 481 .
   Web of Science ®Google Scholar
• Barrentine , L. B. 1991 . Concepts for R&R Studies , Milwaukee, WI : ASQC Quality Press .
   Google Scholar
• Montgomery , D. C. 2005 . Introduction to Statistical Quality Control , 5 , New York : John Wiley and Sons .
   Google Scholar
• Montgomery , D. C. and Runger , G. C. 1993 . Gauge capability analysis and designed experiments. Part II: Experimental design models and variance component estimation . Qual. Eng , 6 ( 2 ) : 289 – 305 .
   Google Scholar
• Burdick , R. K. , Borror , C. M. and Montgomery , D. C. 2003 . A review of methods for measurement systems capability analysis . J. Qual. Technol , 35 ( 4 ) : 342 – 354 .
   Web of Science ®Google Scholar
• Montgomery , D. C. 2001 . Introduction to Statistical Quality Control , 4 , New York : John Wiley & Sons .
   Google Scholar
• Levinson , W. A. 1996 . Do you need a new gauge? . Semicond. Int , : 113 – 116 . February
   Google Scholar
• Pearn , W. L. and Wu , C. W. 2005 . Process capability assessment for index Cpk based on Bayesian approach . Metrika , 61 ( 2 ) : 221 – 234 .
   Web of Science ®Google Scholar
• Burdick , R. K. , Park , Y. J. , Montgomery , D. C. and Borror , C. M. 2005 . Confidence intervals for misclassification rates in a gauge R&R study . J. Qual. Technol , 37 ( 4 ) : 294 – 303 .
   Web of Science ®Google Scholar
• Houf , R. F. and Berman , D. B. 1988 . Statistical analysis of power module thermal test equipment performance . IEEE Trans. Compon. Hybrids Manuf. Technol , 11 ( 4 ) : 516 – 520 .
   Google Scholar