References
- Montgomery DC. Introduction to statistical quality control. 6th ed. New York: Wiley; 2009.
- Xie M, Goh TN, Kuralmani V. Statistical models and control charts for high-quality processes. Boston: Kluwer Academic Publisher; 2002.
- Woodall WH. The use of control charts in health-care and public-health surveillance. J Qual Technol. 2006;38:89–104.
- Chan LY, Xie M, Goh TN. Cumulative quantity control charts for monitoring production processes. Int J Prod Res. 2000;38:397–408. doi: 10.1080/002075400189482
- Xie M, Goh TN, Ranjan GP. Some effective control chart procedures for reliability monitoring. Reliab Eng Syst Saf. 2002;77:143–150. doi: 10.1016/S0951-8320(02)00041-8
- Gan FF. Design of optimal exponential CUSUM control charts. J Qual Technol. 1994;26:109–124.
- Gan FF. Designs of one- and two-sided exponential EWMA charts. J Qual Technol. 1998;30:55–69.
- Gan FF, Chang TC. Computing average run lengths of exponential EWMA charts. J Qual Technol. 2000;32:183–187.
- Qu L, Wu Z, Liu TI. A control scheme integrating the T chart and TCUSUM chart. Qual Reliab Eng Int. 2011;27:529–539. doi: 10.1002/qre.1153
- Scariano SM, Calzada ME. A note on the lower-sided synthetic chart for exponentials. Qual Eng. 2003;15:677–680. doi: 10.1081/QEN-120018399
- Yen FY, Khoo MBC, Lee MH. Synthetic-type control charts for time-between-events monitoring. PLoS ONE. 2013;8:e65440. doi: 10.1371/journal.pone.0065440
- Xie YJ, Tsui KL, Xie M, Goh TN. Monitoring time-between-events for health management. Prognostics and Health Management Conference; 2010. p. 1–8.
- Santiago E, Smith J. Control charts based on the exponential distribution: adapting runs rules for the t chart. Qual Eng. 2013;25:85–96. doi: 10.1080/08982112.2012.740646
- Western Electric Company. Statistical quality control handbook. Indianapolis; 1956.
- Koutras MV, Bersimis S, Maravelakis PE. Statistical process control using Shewhart control charts with supplementary runs rules. Methodol Comput Appl Probab. 2007;9:207–224. doi: 10.1007/s11009-007-9016-8
- Cheng CS, Chen PW. An ARL-unbiased design of time-between-events control charts with runs rules. J Stat Comput Simul. 2011;81:857–871. doi: 10.1080/00949650903520944
- Chen PW, Cheng CS. On statistical design of the cumulative quantity control chart for monitoring high yield processes. Comm Statist Theory Methods. 2011;40:1911–1928. doi: 10.1080/03610920903391329
- Lowry CA, Champ CW, Woodall WH. The performance of control charts for monitoring process variation. Comm Statist Simulation Comput. 1995;24:409–437. doi: 10.1080/03610919508813250
- Antzoulakos DL, Rakitzis AC. Runs rules schemes for monitoring process variability. J Appl Statist. 2010;37:1231–1247. doi: 10.1080/02664760903002683
- Acosta-Mejia CA. Monitoring reduction in variability with the range. IIE Trans. 1998;30:515–523.
- Acosta-Mejia CA, Pignatiello JJ Jr. ARL-design of S charts with k-of-k runs rules. Comm Statist Simulation Comput. 2009;38:1625–1639. doi: 10.1080/03610910903068159
- Zhang CW, Xie M, Goh TN. Design of exponential control charts using a sequential sampling scheme. IIE Trans. 2006;38:1105–1116. doi: 10.1080/07408170600728905
- Antzoulakos DL, Rakitzis AC. The modified r out of m control chart. Comm Statist Simulation Comput. 2008;37:396–408. doi: 10.1080/03610910701501906
- Lucas JM, Davis DJ, Saniga EM. Detecting improvement using Shewhart attribute control charts when the lower control limit is zero. IIE Trans. 2006;38:699–709. doi: 10.1080/07408170600692317
- Champ CW, Woodall WH. Exact results for Shewhart control charts with supplementary runs rules. Technometrics. 1987;29:393–399. doi: 10.1080/00401706.1987.10488266
- Fu JC, Spiring FA, Xie H. On the average run lengths of quality control schemes using a Markov chain approach. Statist Probab Lett. 2003;56:369–380. doi: 10.1016/S0167-7152(01)00183-3
- Klein M. Modified S-charts for controlling process variability. Comm Statist Simulation Comput. 2000;29:919–940. doi: 10.1080/03610910008813646
- Antzoulakos DL. Waiting times for patterns in a sequence of multistate trials. J Appl Probab. 2001;38:508–518. doi: 10.1239/jap/996986759
- Fu JC, Lou WYW. Distribution theory of runs and patterns and its applications. Singapore: World Scientific; 2003.