References
- Friedman , H. 1945 . Geiger Counter Spectrometer for Industrial Research . Electronics , 18 : 132
- Klug , H. P. , Alexander , L. and Kummer , E. 1948 . X‐ray Diffraction Analysis of Crystalline Dusts . J. Indust. Hyg., & Tox. , 30 : 166
- Klug , H. P. , Alexander , L. and Kummer , E. 1948 . Quantitative Analysis with the X‐ray Spectrometer . Anal. Chem. , 20 : 886
- Clark , G. L. and Reynolds , D. H. 1936 . Quantitative Analysis of Mine Dusts—An X‐ray Diffraction Method . Ind., & Eng. Chem. Anal. , 8 : 36
- Alexander , L. 1948 . Geometrical Factors Affecting the Contours of X‐ray Spectrometer Maxima I—Factors Causing Asymmetry . J. App. Physics , 19 : 1068 – 71 .
- Birks , L. S. 1945 . Geiger Counter Technique for X‐ray Diffraction Part VI. Detailed Considerations of Experimental Conditions . U.S. Nav. Res. Lab. , Rep. H‐2517
- McCreery , G. L. 1949 . Improved Mount for Powdered Specimens Used on the Geiger Counter X‐ray Spectrometer . J. Am. Ceram. Soc. , 32 : 141
- Ballard , J. W. , Oshry , H. I. and Schrenk , H. H. 1943 . Sampling, Mixing, and Grinding Techniques in the Preparation of Samples for Quantitative Analysis by X‐ray Diffraction and Spectrographic Methods . J. Opt. Soc. Am. , 33 : 667
- Taylor , A. 1944 . The Optimum Thickness of Powder Specimens in X‐ray Diffraction Work . Phil. Mag. , 35 : 632