Stacking faults and twins in gallium phosphide layers grown on silicon

References

• Bachmann , K. J. , Rossow , U. and Dietz , N. 1995 . Mater. Sci. Engng. , B35 : 472
   Google Scholar
• Carter , C. B. , Cho , N. H. , Elgat , Z. , Fletcher , R. and Wagner , D. K. 1985 . Microscopy of Semiconducting Materials 1985 , Institute of Physics Conference Series Edited by: Cullis , A. G. and Holt , D. B. Vol. 65 , 221 – 226 . Bristol : Institute of Physics .
   Google Scholar
• Cunningham , B. and Ast , D. 1982 . “ Grain Boundaries in Semiconductors ” . In Materials Research Society Symposium Proceedings , Edited by: Leamy , H. J. , Pike , G. E. and Seager , C. H. Vol. 5 , 21 – 26 . Pittsburgh, Pennsylvania : Materials Research Society .
   Google Scholar
• Dahmen , U. , Westmacott , K. H. , Pirouz , P. and Chaim , R. 1990 . Acta metall. mater. , 38 : 323
   Google Scholar
• de Cooman , B. C. , Cho , N. H. , Elgat , Z. and Carter , C. B. 1985 . Ultramicroscopic , 18 : 305
   Web of Science ®Google Scholar
• de Rujiter , W. J. , Sharma , R. , McCartney , M. R. and Smith , D. J. 1995 . Ultra microscopy , 57 : 409
   Google Scholar
• Ernst , F. and Pirouz , P. 1988 . J. appl. Phys. , 64 : 4526 1989, J. Mater. Res. 4, 834.
   Web of Science ®Google Scholar
• Gao , H. , Ozkan , C. S. , Nix , W. D. , Zimmerman , J. A. and Freund , L. B. 1999 . Phil. Mag. A , 79 : 349
   Google Scholar
• Holt , D. B. 1984 . J. Mater. Sci. , 19 : 439
   Google Scholar
• Kaxiras , E. 1995 . Mater. Sci. Engng. , B30 : 175
   Google Scholar
• Kelliher , J. T. , Thornton , J. , Dietz , N. , Lucovsky , G. and Bachmann , K. J. 1993 . Mater. Sci. Engng. , B22 : 97
   Google Scholar
• Legoues , F. K. , Copel , M. and Tromp , R. 1989 . Phys. Rev. Lett. , 63 : 1826
   PubMed Web of Science ®Google Scholar
• Mahajan , S. and Chin , G. Y. 1974 . Acta metall. , 22 : 1113
   Google Scholar
• Meddeb , J. , Ambri , M. , Pitaval , M. , Draidia , N. , Dieter , R. J. and Scholz , F. 1993 . Microscopy of Semiconducting Materials 1993 , Institute of Physics Conference Series Edited by: Cullis , A. G. , Staton-Bevan , A. E. and Hutchison , J. L. Vol. 134 , 361 – 364 . Bristol : Institute of Physics .
   Google Scholar
• Merkle , K. L. and Wolf , D. 1992 . Phil. Mag. A , 65 : 513
   Google Scholar
• Mullner , P. , Gao , H. and Ozkan , C. S. 1997 . Phil. Mag. A , 75 : 925
   Google Scholar
• Narayanan , V. 1999 . Pittsburgh, Pennsylvania : Carnegie Mellon University . PhD Thesis
   Google Scholar
• Narayanan , V. , Mahajan , S. , Sukidi , N. , Bachmann , K. J. , Woods , V. and Dietz , N. 2000 . Phil. Mag. A , 80 : 555
   Google Scholar
• Narayanan , V. , Sukidi , N. , Bachmann , K. J. and Mahajan , S. 1999 . Thin Solid Films , 357 : 53
   Google Scholar
• Ozkan , C. S. , Nix , W. D. and Gao , H. 1997 . Defects in Electronic Materials II , Edited by: Michel , J. Vol. 442 , 373 – 379 . Pittsburgh, Pennsylvania : Materials Research Society . Materials Research Society Symposium Proceedings
   Google Scholar
• Papon , A. M. , Petit , M. , Silvestre , G. and Bacmann , J. J. 1982 . Grain Boundaries in Semiconductors , Edited by: Leamy , H. J. , Pike , G. E. and Seager , C. H. Vol. 5 , 27 – 32 . Pittsburgh, Pennsylvania : Materials Research Society . Materials Research Society Symposium Proceedings
   Google Scholar
• Pirouz , P. , Chaim , R. , Dahmen , U. and Westmacott , K. H. 1990 . Acta metall. mater. , 38 : 313
   Google Scholar
• Uhrberg , R. I. G. , Bringans , R. D. , Bachrach , R. Z. and Northrup , J. E. 1986 . J. vac. Sci. Technol. A , 4 : 1259
   Google Scholar