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Original Articles

Composition determination in the GaAs/(Al, Ga)As system using contrast in dark-field transmission electron microscope images

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Pages 39-62 | Received 19 Sep 1988, Accepted 25 Sep 1988, Published online: 20 Aug 2006

References

  • Baxter , C. S. and Stobbs , W. M. 1988 . Proceedings of EMAG '87: Analytical Electron Microscopy , Edited by: Lorimer , G. W. 209 London : Institute of Metals .
  • Bithell , E. G. and Stobbs , W. M. 1988 . Proceedings of the Electron Microscopy Society of America 1988 , Edited by: Bailey , G. W. 908 San Francisco, California : San Francisco Press .
  • Bourdillon , A. J. , Stobbs , W. M. , Page , K. , Home , R. , Wilson , C. , Ambrose , B. , Turner , L. J. and Tebby , G. P. 1985 . Proceedings of the Electron Microscopy and Analysis Group, 1985 , Isssnstitute of Physics Conference Series No. 78 161 Bristol : Institute of Physics .
  • Bullock , J. F. , Titchmarsh , J. M. and Humphreys , C. J. 1986 . Semicond. Sci. Technol. , 1 : 343
  • Couch , N. R. , Kelly , M. J. , Kerr , T. M. , Britton , E. G. and Stobbs , W. M. 1987 . Semicond. Sci. Technol. , 2 : 244
  • Davies , R. A. , Bithell , E. G. , Chew , A. , Harris , P. G. , Dineen , C. , Kelly , M. J. , Stobbs , W. M. , Sykes , D. E. and Kerr , T. M. 1989 . Semicond. Sci. Technol. , 4 : 35
  • Doyle , P. A. and Turner , P. S. 1968 . Acta crystallogr. A , 24 : 390
  • Eaglesham , D. J. , Hetherington , C. J. D. and Humphreys , C. J. 1987 . Materials Research Society Symposium Proceedings , Vol. 77 , 473 Pittsburgh, Pennsylvania : Materials Research Society .
  • Eaglesham , D. J. and Humphreys , C. J. 1986 . Proceedings of the 11th International Congress on Electron Microscopy , 209 Kyoto : Japanese Society of Electron Microscopy .
  • Egerton , R. F. 1986 . Electron Energy Loss Spectroscopy in the Electron Microscope , New York : Plenum . Appendix C.
  • Gai , P. L. and Howie , A. 1975 . Phil. Mag. A , 31 : 519
  • Hirsch , P. B. , Howie , A. , Nicholson , R. B. , Pashley , D. W. and Whelan , M. J. 1965 . Electron Microscopy of Thin Crystals , London : Butterworths . Howie, A., 1963, Proc. R. Soc. A, 271, 268.
  • Kakibayashi , H. and Nagata , F. 1985 . Jap. J. appl. Phys. , 24 : L905 1986, Ibid., 25, 1644.
  • Long , A. P. , Kelly , M. J. , Kerr , T. M. , Knowles , K. M. , Britton , E. G. and Stobbs , W. M. 1988 . J. appl. Phys. , 63 : 1603
  • Petroff , P. M. 1977 . J. vac. Sci. Technol. , 14 : 973
  • Ross , F. M. , Bithell , E. G. and Stobbs , W. M. 1988 . Proceedings of EMAG '87: Analytical Electron Microscopy , Edited by: Lorimer , G. W. 205 London : Institute of Metals .
  • Treacy , M. M. J. , Gibson , J. M. and Howie , A. 1985 . Phil. Mag. A , 51 : 389

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